标题:
用分子束外延法生长的立方相ZnxMg1-xO薄膜的性质研究Investigation of Cubic ZnxMg1-xO Films Grown by Molecular Beam Epitaxy
作者:
王小丹, 周华, 耿伟, 康煜堃, 陈晓航, 王惠琼, 周颖慧, 詹华瀚, 康俊勇
关键字:
ZnxMg1-xO薄膜, MgO衬底, 立方结构ZnxMg1-xO Film, MgO Substrate, Cubic Structure
期刊名称:
《Material Sciences》, Vol.5 No.3, 2015-05-12
摘要:
通过分子束外延(MBE)的技术, 在富镁条件下于立方结构的MgO(100)衬底上外延生长立方相的ZnxMg1−xO薄膜。用反射高能电子衍射(RHEED)和X射线衍射(XRD)的方法研究了薄膜的晶体结构，结果表明，薄膜结构为四方相。用硬X射线吸收谱(XAS)的方法研究薄膜的电子结构，用透射谱的方法研究了薄膜的带隙结构；研究表明，ZnxMg1−xO薄膜中x的值约为0.58。
The cubic ZnxMg1−xO films are prepared epitaxially on cubic MgO(100) substrates by Molecular Beam Epitaxy (MBE). The crystal structure is determined by Reflection High Energy Electron Di-fraction (RHEED) which indicates that the phase of the film is cubic structure, consistent with the observation of the X-ray diffraction (XRD) results. The electronic structure is studied by X-ray Ab-sorption Spectroscopy (XAS); the band-gap structure is demonstrated by transmission spectroscopy. It is indicated that the value of x in ZnxMg1−xO films is about 0.58.