International Conference on the Business of Electronic Product Reliability and Liability
Solar cell crack inspection by image processing
作者:
Z. Fu， Y. Zhao， Y. Liu， et al.
关键词:
automatic optical inspection ； crack detection ； image recognition ； reliability ； solar cells ； Gauss-Laplacian transform ； anti-radiation shield bonding process ； contour detection ； crack recognition ； edge cracks
摘要:
Spacecraft operate in a hostile environment, far from the Earth, so it is necessary for solar cells with anti-radiation properties to have a bonding process carried out on them. After bonding, an essential process for the solar cell assembly is to inspect for cracks on the edges or inside the solar cell. To avoid utilizing unqualified products and to improve the reliability of products, this paper presents a method to detect the cracks of solar cell by image processing. This method utilizes the gray transform, image adjustment, Gauss-Laplacian transform, contour detection, crack recognition, and so on. The validity of this method has been verified by experiment.
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