K. Bierbaum, M. Kinzler, Ch. Woell, M. Grunze, G. Haehner, S. Heid and F. Effenberger. A near edge x-ray absorption fine struc- ture spectroscopy and x-ray photoelectron spectroscopy study of the film properties of self-assembled monolayers of organosi- lanes on oxidized Si(100). Langmuir, 1995, 11(2): 512-518.