摘要:
本文基于表面热阻的概念导出一种固体微/纳薄膜热导率与尺寸关系的模型。该模型表明固体薄膜热导率倒数与薄膜厚度倒数之间存在线性关系，其斜率和截距分别是表面热阻和固体材料热导率的倒数。本文通过用分子动力学模拟计算厚度为2~14 nm的固体氩晶体薄膜热导率验证了该模型的正确性，并且用声子散射理论和文献数据对其加以佐证。
A model on the size dependence of the thermal conductivity of solid micro/nano-film is derived based on a concept named thermal surface resistance. The model shows a linear relationship between the reciprocals of the normal thermal conductivity of solid thin films and the film thickness, whose slope and intercept are respectively the thermal surface resistance and the reciprocal of the corresponding bulk thermal conductivity. It is confirmed not only by our molecular dynamics simulations of the thermal conductivity of solid argon crystal films with thickness of 2 - 14 nm, but also by phonon scattering theory and data in literatures.